Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials.

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第一作者： Pavel,Linkov

第一单位： Laboratory of Nano-Bioengineering, National Research Nuclear University, Moscow Engineering Physics Institute, 31 Kashirskoe sh., 115409 Moscow, Russian Federation. igor.nabiev@gmail.com.

作者： Pavel,Linkov ^[1] ; Mikhail,Artemyev ; Anton E,Efimov ; Igor,Nabiev

作者单位： Laboratory of Nano-Bioengineering, National Research Nuclear University, Moscow Engineering Physics Institute, 31 Kashirskoe sh., 115409 Moscow, Russian Federation. igor.nabiev@gmail.com. ^[1]

DOI 10.1039/c3nr02372a

PMID 23934544

发布时间 2013-09-16

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Nanoscale

2013年5卷19期

8781-98页

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Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials.

Nanoscale

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Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials.

Nanoscale

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Nanoscale

相关期刊

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