Quantification of deep traps in nanocrystal solids, their electronic properties, and their influence on device behavior.
第一作者:
Deniz,Bozyigit
第一单位:
Department of Information Technology and Electrical Engineering, ETH Zurich , Gloriastr. 35, 8092 Zurich, Switzerland.
作者:
DOI
10.1021/nl402803h
PMID
24164600
发布时间
2020-10-01
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Nano letters
5284-8页
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