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A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction.

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第一作者： K,Babinsky

第一单位： Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef Straße 18, 8700 Leoben, Austria. Electronic address: katharina.babinsky@unileoben.ac.at.

作者： K,Babinsky ^[1] ; R,De Kloe ^[2] ; H,Clemens ^[3] ; S,Primig ^[4]

作者单位： Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef Straße 18, 8700 Leoben, Austria. Electronic address: katharina.babinsky@unileoben.ac.at. ^[1] AMETEK B. V., EDAX business unit, PO Box 4144, 5004JC Tilburg, The Netherlands. Electronic address: rene.de.kloe@ametek.nl. ^[2] Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef Straße 18, 8700 Leoben, Austria. Electronic address: helmut.clemens@unileoben.ac.at. ^[3] Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef Straße 18, 8700 Leoben, Austria. Electronic address: sophie.primig@unileoben.ac.at. ^[4]

关键词 Atom probe tomography (APT)Focused ion beam (FIB)Grain boundary segregation Transmission Kikuchi diffraction (TKD)Transmission electron backscatter diffraction (t-EBSD)Transmission electron forward scatter diffraction (t-EFSD)

DOI 10.1016/j.ultramic.2014.04.003

PMID 24815026

发布时间 2014-07-02

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