作者单位:
Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China. Liuj@nuc.edu.cn.
[1]
Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China. Liuj@nuc.edu.cn.
[2]
Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China. yuanyukun_ever@163.com.
[3]
Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China. yuanyukun_ever@163.com.
[4]
Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China. rz381567720@163.com.
[5]
Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China. tanqiulin@nuc.edu.cn.
[6]
Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China. tanqiulin@nuc.edu.cn.
[7]
Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China. xiongjijun@nuc.edu.cn.
[8]
Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China. xiongjijun@nuc.edu.cn.
[9]
DOI
10.3390/s150922660
PMID
26370999
发布时间
2019-01-08