Large volume serial section tomography by Xe Plasma FIB dual beam microscopy.

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作者： T L,Burnett ^[1] ; R,Kelley ^[2] ; B,Winiarski ^[1] ; L,Contreras ^[2] ; M,Daly ^[3] ; A,Gholinia ^[3] ; M G,Burke ^[3] ; P J,Withers ^[4]

作者单位： School of Materials, University of Manchester, Manchester M13 9PL, UK; FEI Company, Achtseweg Noord 5, Bldg, 5651 GG, Eindhoven, The Netherlands. ^[1] FEI Company, 5350 NE Dawson Creek Drive, Hillsboro, OR 97124, United States. ^[2] School of Materials, University of Manchester, Manchester M13 9PL, UK. ^[3] School of Materials, University of Manchester, Manchester M13 9PL, UK; BP International Centre for Advanced Materials, University of Manchester, Manchester M13 9PL, UK. Electronic address: P.J.Withers@manchester.ac.uk. ^[4]

关键词 3D imaging A508 grade 3 steel Scanning electron microscopy X-ray micro-tomography (micro-CT)Xe(+) Plasma FIB-SEM dual beam microscope

DOI 10.1016/j.ultramic.2015.11.001

PMID 26683814

发布时间 2017-07-28

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Ultramicroscopy

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Large volume serial section tomography by Xe Plasma FIB dual beam microscopy.

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Large volume serial section tomography by Xe Plasma FIB dual beam microscopy.

Ultramicroscopy

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Ultramicroscopy

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