Traceable Quantitative Raman Microscopy and X-ray Fluorescence Analysis as Nondestructive Methods for the Characterization of Cu(In,Ga)Se2 Absorber Films.

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作者： Sabine,Zakel ^[1] ; Beatrix,Pollakowski ^[2] ; Cornelia,Streeck ^[2] ; Stefan,Wundrack ^[3] ; Alfons,Weber ^[4] ; Stefan,Brunken ^[4] ; Roland,Mainz ^[4] ; Burckhardt,Beckhoff ^[2] ; Rainer,Stosch ^[3]

作者单位： Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany Sabine.Zakel@ptb.de. ^[1] Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany. ^[2] Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany. ^[3] Helmholtz-Zentrum Berlin für Materialien und Energie (HZB), Berlin, Germany. ^[4]

关键词 Calibration Cu(In Ga)Se2 International System of Units Measurement uncertainty Raman mapping Raman spectrometry SI Solar cell Traceability X-ray spectrometry

DOI 10.1177/0003702815620131

PMID 26903563

发布时间 2016-02-23

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