Blind deconvolution of 3D fluorescence microscopy using depth-variant asymmetric PSF.

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第一作者： Boyoung,Kim

第一单位： Information and Communication Engineering, Graduate School of Information Science and Technology, the University of Tokyo, Hongo, Bunkyo, Tokyo, 113-8656, Japan.

作者： Boyoung,Kim ^[1] ; Takeshi,Naemura ^[2]

作者单位： Information and Communication Engineering, Graduate School of Information Science and Technology, the University of Tokyo, Hongo, Bunkyo, Tokyo, 113-8656, Japan. ^[1] Manufacturing Core Technology Team, Global Technology Centre, Samsung Electronics, Suwon, Gyeonggi, 443-742, Korea. ^[2]

关键词 3D microscopy blind deconvolution deconvolution fluorescence microscopy

DOI 10.1002/jemt.22650

PMID 27062314

发布时间 2018-02-13

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