A two-stage method to correct aberrations induced by slide slant in bright-field microscopy.

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第一作者： Yilun,Fan

第一单位： The University of Queensland, School of Information Technology and Electrical Engineering, St Lucia, QLD 4072, Australia. Electronic address: y.fan3@uq.edu.au.

作者： Yilun,Fan ^[1] ; Andrew P,Bradley ^[2]

作者单位： The University of Queensland, School of Information Technology and Electrical Engineering, St Lucia, QLD 4072, Australia. Electronic address: y.fan3@uq.edu.au. ^[1] The University of Queensland, School of Information Technology and Electrical Engineering, St Lucia, QLD 4072, Australia. ^[2]

关键词 Coma aberration Phase deconvolution Tilted plane parallel plate Virtual microscopy

DOI 10.1016/j.micron.2016.05.001

PMID 27182660

发布时间 2018-01-18

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Micron (Oxford, England

2016年87卷

18-32页

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A two-stage method to correct aberrations induced by slide slant in bright-field microscopy.

Micron (Oxford, England

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Micron (Oxford, England

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A two-stage method to correct aberrations induced by slide slant in bright-field microscopy.

Micron (Oxford, England

相似文献

Micron (Oxford, England

相关期刊

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