作者：
Jaco J,Geuchies [1]
;
Carlo,van Overbeek [2]
;
Wiel H,Evers [1]
;
Bart,Goris [3]
;
Annick,de Backer [4]
;
Anjan P,Gantapara [5]
;
Freddy T,Rabouw [5]
;
Jan,Hilhorst [6]
;
Joep L,Peters [1]
;
Oleg,Konovalov [7]
;
Andrei V,Petukhov [1]
;
Marjolein,Dijkstra [2]
;
Laurens D A,Siebbeles [8]
;
Sandra,van Aert [9]
;
Sara,Bals [6]
;
Daniel,Vanmaekelbergh [3]
作者单位：
Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Utrecht University, 3584 CC Utrecht, The Netherlands.
[1]
ID10, European Synchrotron Radiation Facility (ESRF), 38000 Grenoble, France.
[2]
Optoelectronic Materials Section, Department of Chemical Engineering, Delft University of Technology, 2629 HZ Delft, The Netherlands.
[3]
Kavli Institute of Nanoscience, Delft University of Technology, 2628 CJ Delft, The Netherlands.
[4]
Electron Microscopy for Materials Science (EMAT), University of Antwerp, 2020 Antwerp, Belgium.
[5]
Soft Condensed Matter, Debye Institute for Nanomaterials Science, Utrecht University, 3584 CC Utrecht, The Netherlands.
[6]
ID01, European Synchrotron Radiation Facility (ESRF), 38000 Grenoble, France.
[7]
Physical and Colloidal Chemistry, Debye Institute for Nanomaterials Science, Utrecht University, 3508 TB Utrecht, The Netherlands.
[8]
Laboratory of Physical Chemistry, Department of Chemical Engineering and Chemistry, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands.
[9]
DOI
10.1038/nmat4746
PMID
27595349
发布时间
2019-04-20
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