Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors.

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作者： H G,Brown ^[1] ; N,Shibata ^[2] ; H,Sasaki ^[3] ; T C,Petersen ^[1] ; D M,Paganin ^[1] ; M J,Morgan ^[1] ; S D,Findlay ^[4]

作者单位： School of Physics and Astronomy, Monash University, Victoria 3800, Australia. ^[1] Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656, Japan. ^[2] Yokohama R&D Lab, Furukawa Electric Ltd., Yokohama 220-0073, Japan. ^[3] School of Physics and Astronomy, Monash University, Victoria 3800, Australia. Electronic address: scott.findlay@monash.edu. ^[4]

关键词 Differential phase contrast (DPC) imaging Electric fields Scanning transmission electron microscopy (STEM)p-n junctions

DOI 10.1016/j.ultramic.2017.07.002

PMID 28692934

发布时间 2018-08-06

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Ultramicroscopy

2017年182卷

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Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors.

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Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors.

Ultramicroscopy

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Ultramicroscopy

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