Markov random field segmentation for industrial computed tomography with metal artefacts.

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作者： Avinash,Jaiswal ^[1] ; Mark A,Williams ^[2] ; Abhir,Bhalerao ^[3] ; Manoj K,Tiwari ^[1] ; Jason M,Warnett ^[2]

作者单位： Department of Industrial and Systems Engineering, IIT Kharagpur, India. ^[1] WMG, University of Warwick, UK. ^[2] Department of Computer Science, University of Warwick, UK. ^[3]

关键词 Computed tomography Markov Random Fields metal artefacts segmentation

主题词算法(Algorithms);伪迹(Artifacts);图像处理, 计算机辅助(Image Processing, Computer-Assisted);工业(Industry);Markov链(Markov Chains);金属(Metals);体层摄影术, X线计算机(Tomography, X-Ray Computed)

DOI 10.3233/XST-17322

PMID 29562573

发布时间 2024-03-30

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Journal of X-ray science and technology

2018年26卷4期

573-591页

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Markov random field segmentation for industrial computed tomography with metal artefacts.

Journal of X-ray science and technology

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Journal of X-ray science and technology

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Markov random field segmentation for industrial computed tomography with metal artefacts.

Journal of X-ray science and technology

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Journal of X-ray science and technology

相关期刊

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