Nanoscale Optical Microscopy and Spectroscopy Using Near-Field Probes.

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第一作者： Richard J,Hermann

第一单位： Department of Chemical Engineering, University of California Santa Barbara, Santa Barbara, California 93106, USA; email: rhermann@ucsb.edu , gordon@ucsb.edu.

作者： Richard J,Hermann ^[1] ; Michael J,Gordon ^[1]

作者单位： Department of Chemical Engineering, University of California Santa Barbara, Santa Barbara, California 93106, USA; email: rhermann@ucsb.edu , gordon@ucsb.edu. ^[1]

关键词 SNOM TERS diffraction limit nanoscale imaging optical spectroscopy scanning near-field optical microscopy tip-enhanced Raman scattering

主题词显微镜检查(Microscopy);显微镜检查, 原子力(Microscopy, Atomic Force);纳米结构(Nanostructures);谱学, 傅里叶变换红外(Spectroscopy, Fourier Transform Infrared);光谱分析, 拉曼(Spectrum Analysis, Raman);表面等离激元(Surface Plasmon Resonance)

DOI 10.1146/annurev-chembioeng-060817-084150

PMID 29596000

发布时间 2019-03-14

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准确一般字义偏差语意偏离译文作用小提交