第一单位:
Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, 01003, USA.
作者:
Zhongrui,Wang [1]
;
Mingyi,Rao [1]
;
Jin-Woo,Han [2]
;
Jiaming,Zhang [3]
;
Peng,Lin [1]
;
Yunning,Li [1]
;
Can,Li [1]
;
Wenhao,Song [1]
;
Shiva,Asapu [1]
;
Rivu,Midya [1]
;
Ye,Zhuo [1]
;
Hao,Jiang [1]
;
Jung Ho,Yoon [1]
;
Navnidhi Kumar,Upadhyay [1]
;
Saumil,Joshi [1]
;
Miao,Hu [3]
;
John Paul,Strachan [3]
;
Mark,Barnell [4]
;
Qing,Wu [4]
;
Huaqiang,Wu [5]
;
Qinru,Qiu [6]
;
R Stanley,Williams [7]
;
Qiangfei,Xia [8]
;
J Joshua,Yang [9]
作者单位:
Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, 01003, USA.
[1]
Center for Nanotechnology, NASA Ames Research Center, Moffett Field, CA, 94035, USA.
[2]
Hewlett-Packard Laboratories, Palo Alto, CA, 94304, USA.
[3]
Air Force Research Lab, Information Directorate, Rome, NY, 13441, USA.
[4]
Institute of Microelectronics, Tsinghua University, Beijing, 100084, China.
[5]
Department of Electrical Engineering and Computer Science, Syracuse University, Syracuse, NY, 13244, USA.
[6]
Hewlett-Packard Laboratories, Palo Alto, CA, 94304, USA. stan.williams@hpe.com.
[7]
Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, 01003, USA. qxia@umass.edu.
[8]
Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, 01003, USA. jjyang@umass.edu.
[9]
DOI
10.1038/s41467-018-05677-5
PMID
30097585
发布时间
2019-08-10