作者：
Wei,Kong [1]
;
Huashan,Li [2]
;
Kuan,Qiao [3]
;
Yunjo,Kim [1]
;
Kyusang,Lee [1]
;
Yifan,Nie [1]
;
Doyoon,Lee [4]
;
Tom,Osadchy [5]
;
Richard J,Molnar [1]
;
D Kurt,Gaskill [6]
;
Rachael L,Myers-Ward [6]
;
Kevin M,Daniels [7]
;
Yuewei,Zhang [7]
;
Suresh,Sundram [7]
;
Yang,Yu [8]
;
Sang-Hoon,Bae [9]
;
Siddharth,Rajan [2]
;
Yang,Shao-Horn [1]
;
Kyeongjae,Cho [8]
;
Abdallah,Ougazzaden [2]
;
Jeffrey C,Grossman [5]
;
Jeehwan,Kim [9]
作者单位：
Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
[1]
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
[2]
Sino-French Institute for Nuclear Energy and Technology, Sun Yat-Sen University, Guangzhou, China.
[3]
Departments of Electrical and Computer Engineering & Materials Science and Engineering, University of Virginia, Charlottesville, VA, USA.
[4]
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, TX, USA.
[5]
MIT Lincoln Laboratory, Lexington, MA, USA.
[6]
US Naval Research Laboratory, Washington, DC, USA.
[7]
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA.
[8]
School of Electrical and Computer Engineering, Georgia Institute of Technology, GT-Lorraine, UMI 2958 Georgia Tech-CNRS, Metz, France.
[9]
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA. jcg@mit.edu.
[10]
Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA. jeehwan@mit.edu.
[11]
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA. jeehwan@mit.edu.
[12]
Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA. jeehwan@mit.edu.
[13]
DOI
10.1038/s41563-018-0176-4
PMID
30297812
发布时间
2019-11-20
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