作者：
Yun-Fei,Li [1]
;
Shu-Yu,Chou [2]
;
Peng,Huang [1]
;
Changtao,Xiao [3]
;
Xiaofeng,Liu [3]
;
Yu,Xie [1]
;
Fangchao,Zhao [1]
;
Yilong,Huang [1]
;
Jing,Feng [1]
;
Haizheng,Zhong [2]
;
Hong-Bo,Sun [3]
;
Qibing,Pei [2]
作者单位：
Department of Materials Science and Engineering, Henry Samueli School of Engineering and Applied Science, University of California Los Angeles, Los Angeles, CA, 90095, USA.
[1]
State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, 2699 Qianjin Street, Changchun, 130012, China.
[2]
Beijing Key Laboratory of Nanophotonics and Ultrafine Optoelectronic Systems, School of Materials Science & Engineering, Micro Nano Technology Center, School of Physics, Beijing Institute of Technology, 5 Zhongguancun South Street, Haidian District, Beijing, 100081, China.
[3]
State Key Lab of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Haidian, Beijing, 100084, China.
[4]
DOI
10.1002/adma.201807516
PMID
30672049
发布时间
2020-09-30
换一批
换一批
