Multifrequency nanoscale impedance microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes.

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第一作者： Artur,Zielinski

第一单位： Department of Electrochemistry, Corrosion and Materials Engineering, Faculty of Chemistry, Gdansk University of Technology, Narutowicza 11/12, 80-233 Gdansk, Poland.

作者： Artur,Zielinski ^[1] ; Mateusz,Cieslik ^[1] ; Michal,Sobaszek ^[2] ; Robert,Bogdanowicz ^[2] ; Kazimierz,Darowicki ^[1] ; Jacek,Ryl ^[3]

作者单位： Department of Electrochemistry, Corrosion and Materials Engineering, Faculty of Chemistry, Gdansk University of Technology, Narutowicza 11/12, 80-233 Gdansk, Poland. ^[1] Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunication and Informatics, Gdansk University of Technology, Narutowicza 11/12, 80-233 Gdansk, Poland. ^[2] Department of Electrochemistry, Corrosion and Materials Engineering, Faculty of Chemistry, Gdansk University of Technology, Narutowicza 11/12, 80-233 Gdansk, Poland. Electronic address: jacek.ryl@pg.edu.pl. ^[3]

关键词 Boron-doped diamond Electrode termination Heterogeneity Multifrequency voltage perturbation Nanoscale impedance microscopy

DOI 10.1016/j.ultramic.2019.01.004

PMID 30772716

发布时间 2019-11-20

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