Cellogram: On-the-Fly Traction Force Microscopy.

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作者： Tobias,Lendenmann ^[1] ; Teseo,Schneider ^[2] ; Jérémie,Dumas ^[2] ; Marco,Tarini ^[2] ; Costanza,Giampietro ^[3] ; Apratim,Bajpai ^[4] ; Weiqiang,Chen ^[5] ; Julia,Gerber ^[6] ; Dimos,Poulikakos ^[6] ; Aldo,Ferrari ^[1] ; Daniele,Panozzo ^[1]

作者单位： Laboratory of Thermodynamics in Emerging Technologies and #Institute for Mechanical Systems , ETH Zurich , Zurich 8092 , Switzerland. ^[1] Courant Institute of Mathematical Sciences , New York University , New York 10003 , United States. ^[2] nTopology , New York 10013 , United States. ^[3] Department of Computer Science , Università degli Studi di Milano , Milano 20133 , Italy. ^[4] Swiss Federal Laboratories for Materials Science and Technology , EMPA , Dübendorf 8600 , Switzerland. ^[5] Department of Mechanical and Aerospace Engineering , New York University , New York 11201 , United States. ^[6]

关键词 Real time analysis cTFM focal adhesion reference free stress fibers traction force microscopy

DOI 10.1021/acs.nanolett.9b01505

PMID 31538794

发布时间 2024-06-08

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