Pulsed current-voltage electrodeposition of stoichiometric Bi<sub>2</sub>Te<sub>3</sub> nanowires and their crystallographic characterization by transmission electron backscatter diffraction.
第一作者:
Cristina V,Manzano
第一单位:
Instituto de Micro y Nanotecnología, IMN-CNM, CSIC (CEI UAM+CSIC) Isaac Newton, 8, E-28760, Tres Cantos, Spain.;Laboratory for Mechanics of Materials and Nanostructures, Empa, Swiss Federal Laboratories for Materials Science and Technology, Thun, Switzerland.
作者:
关键词
102 Porous / Nanoporous / Nanostructured materials300 Processing / Synthesis and Recycling301 Chemical syntheses / processing302 Crystallization / Heat treatment / Crystal growth503 TEM504 X-ray / Neutron diffraction and scatteringPulsed electrodepositionSEMSTEMbismuth telluridenanowiresthermoelectric materialstransmission electron backscatter diffraction (t-EBSD)
DOI
10.1080/14686996.2019.1671778
PMID
31723369
发布时间
2020-09-29
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Science and technology of advanced materials
2019年20卷1期
1022-1030页
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