首页> Micron (Oxford, England : 1993)> A review of sample thickness effects on high-resolution transmission electron microscopy imaging.

A review of sample thickness effects on high-resolution transmission electron microscopy imaging.

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第一作者： Shouqing,Li

第一单位： Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China; University of Chinese Academy of Sciences, Beijing 100049, China.

作者： Shouqing,Li ^[1] ; Yunjie,Chang ^[2] ; Yumei,Wang ^[3] ; Qiang,Xu ^[4] ; Binghui,Ge ^[5]

作者单位： Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China; University of Chinese Academy of Sciences, Beijing 100049, China. ^[1] Department of Microbial Pathogenesis, Yale University School of Medicine, New Haven, CT 06511, United States; Microbial Sciences Institute, Yale University, West Haven, CT 06516, United States. ^[2] Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China. ^[3] Nanodim-GZ, Guangzhou 510290, China. ^[4] Institutes of Physical Science and Information Technology, Anhui University, Hefei 230601, China; Key Laboratory of Structure and Functional Regulation of Hybrid Material (Anhui University), Ministry of Education, Hefei 230601, China. Electronic address: bhge@ahu.edu.cn. ^[5]

关键词 Dynamical effect High-resolution transmission electron microscopy Non-linear effect Sample thickness

医学主题词图像处理, 计算机辅助(Image Processing, Computer-Assisted);显微镜检查, 电子, 透射(Microscopy, Electron, Transmission);非线性动力学(Nonlinear Dynamics);标本制备(Specimen Handling)

DOI 10.1016/j.micron.2019.102813

PMID 31927411

发布时间 2020-09-24

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