第一单位：
Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, United States of America.;Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, United States of America.
作者：
Kurt G,Schilling [1]
;
Justin,Blaber [2]
;
Colin,Hansen [3]
;
Leon,Cai [4]
;
Baxter,Rogers [1]
;
Adam W,Anderson [5]
;
Seth,Smith [5]
;
Praitayini,Kanakaraj [2]
;
Tonia,Rex [6]
;
Susan M,Resnick [7]
;
Andrea T,Shafer [7]
;
Laurie E,Cutting [8]
;
Neil,Woodward [9]
;
David,Zald [10]
;
Bennett A,Landman [11]
作者单位：
Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, United States of America.;Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, United States of America.
[1]
Electrical Engineering, Vanderbilt University, Nashville, TN, United States of America.
[2]
Computer Science, Vanderbilt University, Nashville, TN, United States of America.
[3]
Biomedical Engineering, Vanderbilt University, Nashville, TN, United States of America.
[4]
Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, United States of America.;Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, United States of America.;Computer Science, Vanderbilt University, Nashville, TN, United States of America.
[5]
Vanderbilt Eye Institute, Vanderbilt University Medical Center, Nashville, TN, United States of America.
[6]
Laboratory of Behavioral Neuroscience, National Institute on Aging, National Institutes of Health, Baltimore, MD, United States of America.
[7]
Special Education, Vanderbilt University, Nashville, TN, United States of America.
[8]
Psychiatry and Behavioral Sciences, Vanderbilt University Medical Center, Nashville, TN, United States of America.
[9]
Neuroscience, Vanderbilt University, Nashville, TN, United States of America.
[10]
Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, United States of America.;Vanderbilt University Institute of Imaging Science, Vanderbilt University, Nashville, TN, United States of America.;Electrical Engineering, Vanderbilt University, Nashville, TN, United States of America.
[11]
DOI
10.1371/journal.pone.0236418
PMID
32735601
发布时间
2026-03-25
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