作者：
A Gilad,Kusne [1]
;
Heshan,Yu [2]
;
Changming,Wu [3]
;
Huairuo,Zhang [4]
;
Jason,Hattrick-Simpers [5]
;
Brian,DeCost [6]
;
Suchismita,Sarker [7]
;
Corey,Oses [7]
;
Cormac,Toher [8]
;
Stefano,Curtarolo [9]
;
Albert V,Davydov [9]
;
Ritesh,Agarwal [9]
;
Leonid A,Bendersky [5]
;
Mo,Li [10]
;
Apurva,Mehta [5]
;
Ichiro,Takeuchi [6]
作者单位：
Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA. aaron.kusne@nist.gov.
[1]
Materials Science and Engineering Department, University of Maryland, College Park, MD, 20742, USA. aaron.kusne@nist.gov.
[2]
Materials Science and Engineering Department, University of Maryland, College Park, MD, 20742, USA.
[3]
Electrical & Computer Engineering Department, University of Washington, Seattle, WA, 98195, USA.
[4]
Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA.
[5]
Theiss Research, Inc., La Jolla, CA, 92037, USA.
[6]
Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA.
[7]
Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA, 94025, USA.
[8]
Mechanical Engineering and Materials Science Department and Center for Autonomous Materials Design, Duke University, Durham, NC, 27708, USA.
[9]
Materials Science and Engineering Department, University of Pennsylvania, Philadelphia, PA, 19104, USA.
[10]
Materials Science and Engineering Department, University of Maryland, College Park, MD, 20742, USA. takeuchi@umd.edu.
[11]
Maryland Quantum Materials Center, University of Maryland, College Park, MD, 20742, USA. takeuchi@umd.edu.
[12]
DOI
10.1038/s41467-020-19597-w
PMID
33235197
发布时间
2020-12-07
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