Optical and Electron Microscopy for Analysis of Nanomaterials.

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作者： Hyoyeon,Kim ^[1] ; Michael M,Murata ^[2] ; Hyejin,Chang ^[3] ; Sang Hun,Lee ^[4] ; Jaehi,Kim ^[5] ; Jong Hun,Lee ^[6] ; Won-Yeop,Rho ^[1] ; Bong-Hyun,Jun ^[7]

作者单位： School of International Engineering and Science, Jeonbuk National University, Jeonju, Republic of Korea. ^[1] Department of Surgery, Cedars-Sinai Medical Center, Los Angeles, CA, USA. ^[2] Division of Science Education, Kangwon National University, Chuncheon, Republic of Korea. ^[3] Department of Chemical and Biological Engineering, Hanbat National University, Daejeon, Republic of Korea. ^[4] Department of Bioscience and Biotechnology, Konkuk University, Seoul, South Korea. ^[5] Department of Food Science and Biotechnology, Gachon University, Seongnam, Republic of Korea. ^[6] Department of Bioscience and Biotechnology, Konkuk University, Seoul, South Korea. bjun@konkuk.ac.kr. ^[7]

关键词 Atomic force microscopy (AFM)Electron microscopy (EM)Microscopy Near-field scanning optical microscopy (NSOM)Scanning electron microscopy (SEM)Scanning probe microscopy (SPM)Scanning tunneling microscopy (STM)Transmission electron microscopy (TEM)

主题词显微镜检查, 原子力(Microscopy, Atomic Force);显微镜检查, 电子, 扫描(Microscopy, Electron, Scanning);显微镜检查, 扫描探针(Microscopy, Scanning Probe);纳米粒子(Nanoparticles);纳米结构(Nanostructures)

DOI 10.1007/978-981-33-6158-4_12

PMID 33782877

发布时间 2021-03-31

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准确一般字义偏差语意偏离译文作用小提交