Evaluation of the Defect Cluster Content in Singly and Doubly Doped Ceria through In Situ High-Pressure X-ray Diffraction.

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第一作者： Cristina,Artini

第一单位： DCCI, Department of Chemistry and Industrial Chemistry, University of Genova, Via Dodecaneso 31, 16146 Genova, Italy.

作者： Cristina,Artini ^[1] ; Sara,Massardo ^[2] ; Maria Maddalena,Carnasciali ^[1] ; Boby,Joseph ^[1] ; Marcella,Pani ^[3]

作者单位： DCCI, Department of Chemistry and Industrial Chemistry, University of Genova, Via Dodecaneso 31, 16146 Genova, Italy. ^[1] Institute of Condensed Matter Chemistry and Technologies for Energy, National Research Council, CNR-ICMATE, Via De Marini 6, 16149 Genova, Italy. ^[2] INSTM, Genova Research Unit, Via Dodecaneso 31, 16146 Genova, Italy. ^[3] Elettra-Sincrotrone Trieste S.C.p.A., ss 14, km 163.5, Basovizza, 34149 Trieste, Italy. ^[4] CNR-SPIN Genova, Corso Perrone 24, 16152 Genova, Italy. ^[5]

DOI 10.1021/acs.inorgchem.1c00433

PMID 33929819

发布时间 2021-07-15

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Inorganic chemistry

2021年60卷10期

7306-7314页

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Evaluation of the Defect Cluster Content in Singly and Doubly Doped Ceria through In Situ High-Pressure X-ray Diffraction.

Inorganic chemistry

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Evaluation of the Defect Cluster Content in Singly and Doubly Doped Ceria through In Situ High-Pressure X-ray Diffraction.

Inorganic chemistry

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Inorganic chemistry

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