作者：
Xueying,Zhang [1]
;
Wenlong,Cai [2]
;
Mengxing,Wang [2]
;
Biao,Pan [2]
;
Kaihua,Cao [3]
;
Maosen,Guo [4]
;
Tianrui,Zhang [2]
;
Houyi,Cheng [2]
;
Shaoxin,Li [3]
;
Daoqian,Zhu [2]
;
Lin,Wang [5]
;
Fazhan,Shi [4]
;
Jiangfeng,Du [4]
;
Weisheng,Zhao [3]
作者单位：
Fert Beijing Institute MIIT Key Laboratory of Spintronics School of Integrated Circuit Science and Engineering Beihang University Beijing 100191 China.;Beihang-Goertek Joint Microelectronics Institute Qingdao Research Institute of Beihang University Qingdao 266000 China.;Truth Instruments Co. Ltd. Qingdao 266000 China.
[1]
Fert Beijing Institute MIIT Key Laboratory of Spintronics School of Integrated Circuit Science and Engineering Beihang University Beijing 100191 China.
[2]
Fert Beijing Institute MIIT Key Laboratory of Spintronics School of Integrated Circuit Science and Engineering Beihang University Beijing 100191 China.;Beihang-Goertek Joint Microelectronics Institute Qingdao Research Institute of Beihang University Qingdao 266000 China.
[3]
CAS Key Laboratory of Microscale Magnetic Resonance and Department of Modern Physics University of Science and Technology of China Hefei 230026 China.
[4]
Beihang-Goertek Joint Microelectronics Institute Qingdao Research Institute of Beihang University Qingdao 266000 China.;Truth Instruments Co. Ltd. Qingdao 266000 China.
[5]
DOI
10.1002/advs.202004645
PMID
34026457
发布时间
2024-09-28
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