作者：
Ye,Yu [1]
;
Tao,Wang [2]
;
Xiufang,Chen [3]
;
Lidong,Zhang [1]
;
Yang,Wang [1]
;
Yunfei,Niu [1]
;
Jiaqi,Yu [1]
;
Haotian,Ma [1]
;
Xiaomeng,Li [4]
;
Fang,Liu [5]
;
Gaoqiang,Deng [1]
;
Zhifeng,Shi [6]
;
Baolin,Zhang [1]
;
Xinqiang,Wang [5]
;
Yuantao,Zhang [7]
作者单位：
State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Qianjin Street 2699, Changchun, 130012, China.
[1]
Electron Microscopy Laboratory, School of Physics, Peking University, Beijing, 100871, China.
[2]
State Key Laboratory of Crystal Materials, Shandong University, Jinan, 250100, China. cxf@sdu.edu.cn.
[3]
State Key Laboratory of Crystal Materials, Shandong University, Jinan, 250100, China.
[4]
State Key Laboratory for Mesoscopic Physics and Frontiers Science Center for Nano-optoelectronics, School of Physics, Peking University, Beijing, 100871, China.
[5]
Key Laboratory of Materials Physics of Ministry of Education, School of Physics and Microelectronics, Zhengzhou University, Zhengzhou, 450052, China.
[6]
State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Qianjin Street 2699, Changchun, 130012, China. zhangyt@jlu.edu.cn.
[7]
DOI
10.1038/s41377-021-00560-3
PMID
34083511
发布时间
2021-06-08
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