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Extended Barrier Lifetime of Partially Cracked Organic/Inorganic Multilayers for Compliant Implantable Electronics.

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第一作者： Kyungjin,Kim

第一单位： Bertarelli Foundation Chair in Neuroprosthetic Technology, Laboratory for Soft Bioelectronic Interfaces, Institute of Microengineering, Institute of Bioengineering, Centre for Neuroprosthetics, École Polytechnique Fédérale de Lausanne, Geneva, 1202, Switzerland.;Laboratory for Processing of Advanced Composites, Institute of Materials, School of Engineering, École Polytechnique Fédérale de Lausanne, Lausanne, 1015, Switzerland.

作者： Kyungjin,Kim ^[1] ; Matthias,Van Gompel ^[2] ; Kangling,Wu ^[3] ; Giuseppe,Schiavone ^[3] ; Julien,Carron ^[4] ; Florian,Bourgeois ^[2] ; Stéphanie P,Lacour ^[3] ; Yves,Leterrier ^[4]

作者单位： Bertarelli Foundation Chair in Neuroprosthetic Technology, Laboratory for Soft Bioelectronic Interfaces, Institute of Microengineering, Institute of Bioengineering, Centre for Neuroprosthetics, École Polytechnique Fédérale de Lausanne, Geneva, 1202, Switzerland.;Laboratory for Processing of Advanced Composites, Institute of Materials, School of Engineering, École Polytechnique Fédérale de Lausanne, Lausanne, 1015, Switzerland. ^[1] Comelec SA, La Chaux-de-Fonds, 2300, Switzerland. ^[2] Bertarelli Foundation Chair in Neuroprosthetic Technology, Laboratory for Soft Bioelectronic Interfaces, Institute of Microengineering, Institute of Bioengineering, Centre for Neuroprosthetics, École Polytechnique Fédérale de Lausanne, Geneva, 1202, Switzerland. ^[3] Laboratory for Processing of Advanced Composites, Institute of Materials, School of Engineering, École Polytechnique Fédérale de Lausanne, Lausanne, 1015, Switzerland. ^[4]

关键词 atomic layer deposition crack onset strains flexible interdigitated electrodes organic/inorganic multilayers stretchable conductors

医学主题词氧化铝(Aluminum Oxide);电极(Electrodes);电子学(Electronics);假体和植入物(Prostheses and Implants);结果可重复性(Reproducibility of Results)

DOI 10.1002/smll.202103039

PMID 34477315

发布时间 2021-10-29

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