A Machine Learning Attack Resilient True Random Number Generator Based on Stochastic Programming of Atomically Thin Transistors.

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作者： Akshay,Wali ^[1] ; Harikrishnan,Ravichandran ^[2] ; Saptarshi,Das ^[1]

作者单位： Electrical Engineering and Computer Science, Penn State University, University Park, Pennsylvania 16802, United States. ^[1] Engineering Science and Mechanics, Penn State University, University Park, Pennsylvania 16802, United States. ^[2] Materials Science and Engineering, Penn State University, University Park, Pennsylvania 16802, United States. ^[3] Materials Research Institute, Pennsylvania State University, University Park, Pennsylvania 16802, United States. ^[4]

关键词 Internet of things charge trapping/detrapping field effect transistors floating gate hardware security machine learning random numbers

DOI 10.1021/acsnano.1c05984

PMID 34665596

发布时间 2022-11-09

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