Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images.

导出 LinkOut

翻译打印收藏纠错

作者： Haotian,Wen ^[1] ; José María,Luna-Romera ^[2] ; José C,Riquelme ^[2] ; Christian,Dwyer ^[3] ; Shery L Y,Chang ^[1]

作者单位： School of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052, Australia. ^[1] Software and Computing Systems, Universidad de Sevilla, 41004 Seville, Spain. ^[2] Electron Imaging and Spectroscopy Tools, Sydney, NSW 2219, Australia. ^[3] Mark Wainwright Analytical Centre, Electron Microscope Unit, University of New South Wales, Sydney, NSW 2052, Australia. ^[4]

关键词 image analysis machine learning nanoparticles

DOI 10.3390/nano11102706

PMID 34685147

发布时间 2021-10-26

翻译满意度评价：

准确一般字义偏差语意偏离译文作用小提交

浏览0

Nanomaterials (Basel, Switzerland)

2021年11卷10期

相似文献

中文期刊
外文期刊
学位论文
会议论文

检索历史清除

Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images.

Nanomaterials (Basel, Switzerland)

相似文献

Nanomaterials (Basel, Switzerland)

相关期刊

参考文献：
指定格式：	NoteExpress EndNote RefWorks NoteFirst

检索历史 清除

Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images.

Nanomaterials (Basel, Switzerland)

相似文献

Nanomaterials (Basel, Switzerland)

相关期刊

检索历史清除