Comprehensive and accurate analysis of the working principle in ferroelectric tunnel junctions using low-frequency noise spectroscopy.

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第一作者： Wonjun,Shin

第一单位： Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul 08826, Republic of Korea. jhl@snu.ac.kr.

作者： Wonjun,Shin ^[1] ; Kyung Kyu,Min ^[1] ; Jong-Ho,Bae ^[2] ; Jiyong,Yim ^[3] ; Dongseok,Kwon ^[4] ; Yeonwoo,Kim ^[1] ; Junsu,Yu ^[1] ; Joon,Hwang ^[1] ; Byung-Gook,Park ^[1] ; Daewoong,Kwon ^[1] ; Jong-Ho,Lee ^[4]

作者单位： Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul 08826, Republic of Korea. jhl@snu.ac.kr. ^[1] SK Hynix Inc., Icheon 17336, Korea. ^[2] School of Electrical Engineering, Kookmin University, Seoul 02707, Korea. ^[3] Department of Electrical Engineering, Inha University, Incheon, Korea. dw79kwon@inha.ac.kr. ^[4]

DOI 10.1039/d1nr06525d

PMID 34989737

发布时间 2022-02-11

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Nanoscale

2022年14卷6期

2177-2185页

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Comprehensive and accurate analysis of the working principle in ferroelectric tunnel junctions using low-frequency noise spectroscopy.

Nanoscale

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Comprehensive and accurate analysis of the working principle in ferroelectric tunnel junctions using low-frequency noise spectroscopy.

Nanoscale

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Nanoscale

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