首页> Frontiers in plant science> Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield.

Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield.

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第一作者： Philomin,Juliana

第一单位： Borlaug Institute for South Asia (BISA), Ludhiana, India.

作者： Philomin,Juliana ^[1] ; Xinyao,He ^[2] ; Jesse,Poland ^[3] ; Sandesh,Shrestha ^[4] ; Arun K,Joshi ^[5] ; Julio,Huerta-Espino ^[6] ; Velu,Govindan ^[2] ; Leonardo Abdiel,Crespo-Herrera ^[2] ; Suchismita,Mondal ^[2] ; Uttam,Kumar ^[1] ; Pradeep K,Bhati ^[7] ; Manish,Vishwakarma ^[7] ; Ravi P,Singh ^[2] ; Pawan K,Singh ^[2]

作者单位： Borlaug Institute for South Asia (BISA), Ludhiana, India. ^[1] International Maize and Wheat Improvement Center (CIMMYT), Texcoco, Mexico. ^[2] Biological and Environmental Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi Arabia.;Department of Plant Pathology, Wheat Genetics Resource Center, Kansas State University, Manhattan, KS, United States. ^[3] Department of Plant Pathology, Wheat Genetics Resource Center, Kansas State University, Manhattan, KS, United States. ^[4] Borlaug Institute for South Asia (BISA), Ludhiana, India.;International Maize and Wheat Improvement Center (CIMMYT), New Delhi, India. ^[5] Campo Experimental Valle de Mexico, Instituto Nacional de Investigaciones Forestales, Agricolas y Pecuarias (INIFAP), Chapingo, Mexico. ^[6] International Maize and Wheat Improvement Center (CIMMYT), New Delhi, India. ^[7]

关键词 2NS translocation Bipolaris sorokiniana CIMMYT GWAS grain yield spot blotch wheat

DOI 10.3389/fpls.2022.835095

PMID 35310648

发布时间 2022-03-22

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