Terahertz Multiple Echoes Correction and Non-Destructive Testing Based on Improved Wavelet Multi-Scale Analysis.

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作者： Weihua,Xiong ^[1] ; Lijuan,Li ^[2] ; Jiaojiao,Ren ^[3] ; Jian,Gu ^[1] ; Dandan,Zhang ^[2] ; Junwen,Xue ^[3]

作者单位： School of Optoelectronics Engineering, Changchun University of Science and Technology, Changchun 130000, China. ^[1] Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology, Ministry of Education, School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China. ^[2] Zhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528403, China. ^[3]

关键词 multi-scale analysis multiple echoes non-destructive testing time-of-flight

DOI 10.3390/s22093477

PMID 35591167

发布时间 2022-07-16

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