作者：
Shanshan,Liu [1]
;
Zihan,Li [1]
;
Ke,Yang [2]
;
Enze,Zhang [1]
;
Awadhesh,Narayan [3]
;
Xiaoqian,Zhang [4]
;
Jiayi,Zhu [5]
;
Wenqing,Liu [6]
;
Zhiming,Liao [7]
;
Masaki,Kudo [8]
;
Takaaki,Toriyama [8]
;
Yunkun,Yang [1]
;
Qiang,Li [1]
;
Linfeng,Ai [1]
;
Ce,Huang [1]
;
Jiabao,Sun [6]
;
Xiaojiao,Guo [9]
;
Wenzhong,Bao [9]
;
Qingsong,Deng [10]
;
Yanhui,Chen [10]
;
Lifeng,Yin [1]
;
Jian,Shen [1]
;
Xiaodong,Han [10]
;
Syo,Matsumura [8]
;
Jin,Zou [7]
;
Yongbing,Xu [4]
;
Xiaodong,Xu [5]
;
Hua,Wu [1]
;
Faxian,Xiu [1]
作者单位：
State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200433, China.
[1]
College of Science, University of Shanghai for Science and Technology, Shanghai 200093, China.
[2]
Solid State and Structural Chemistry Unit, Indian Institute of Science, Bangalore 560012, India.
[3]
School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China.
[4]
Department of Physics, University of Washington, Seattle, WA 98195-1560, USA.
[5]
Department of Electronic Engineering, Royal Holloway University of London, Egham TW20 0EX, UK.
[6]
Materials Engineering, The University of Queensland, Brisbane QLD 4072, Australia.
[7]
The Ultramicroscopy Research Center, Kyushu University, Fukuoka 819-0395, Japan.
[8]
State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433, China.
[9]
Beijing Key Laboratory of Microstructure and Property of Advanced Materials, Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China.
[10]
DOI
10.1093/nsr/nwab117
PMID
35822066
发布时间
2022-07-25
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