Analysis of Interpretable Data Representations for 4D-STEM Using Unsupervised Learning.

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作者： Alexandra,Bruefach ^[1] ; Colin,Ophus ^[2] ; Mary C,Scott ^[1]

作者单位： Department of Materials Science and Engineering, University of California, Berkeley, CA 94720, USA. ^[1] National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA. ^[2]

关键词 4D-STEM diffraction machine learning nanomaterials scanning transmission electron microscopy

DOI 10.1017/S1431927622012259

PMID 36073035

发布时间 2024-02-16

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Microscopy and microanalysis

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Analysis of Interpretable Data Representations for 4D-STEM Using Unsupervised Learning.

Microscopy and microanalysis

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Analysis of Interpretable Data Representations for 4D-STEM Using Unsupervised Learning.

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