Types and frequency of whole slide imaging scan failures in a clinical high throughput digital pathology scanning laboratory.

导出 OA

翻译打印收藏纠错

作者： Ankush U,Patel ^[1] ; Nada,Shaker ^[1] ; Savannah,Erck ^[1] ; David A,Kellough ^[1] ; Erin,Palermini ^[1] ; Zaibo,Li ^[1] ; Giovanni,Lujan ^[1] ; Swati,Satturwar ^[1] ; Anil V,Parwani ^[1]

作者单位： The Ohio State University Wexner Medical Center Department of Pathology, 450 W 10th Ave, Columbus, OH 43210, USA. ^[1]

关键词 Digital pathology (DP)Laboratory workflow Quality assurance WSI scan failure types WSI scan frequency WSI turnaround time (TAT)Whole slide imaging (WSI)

DOI 10.1016/j.jpi.2022.100112

PMID 36268081

发布时间 2022-10-22

翻译满意度评价：

准确一般字义偏差语意偏离译文作用小提交

浏览0

Journal of pathology informatics

2022年13卷

100112页

相似文献

中文期刊
外文期刊
学位论文
会议论文

检索历史清除

Types and frequency of whole slide imaging scan failures in a clinical high throughput digital pathology scanning laboratory.

Journal of pathology informatics

相似文献

Journal of pathology informatics

相关期刊

参考文献：
指定格式：	NoteExpress EndNote RefWorks NoteFirst

检索历史 清除

Types and frequency of whole slide imaging scan failures in a clinical high throughput digital pathology scanning laboratory.

Journal of pathology informatics

相似文献

Journal of pathology informatics

相关期刊

检索历史清除