A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources.

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作者： Nazanin,Samadi ^[1] ; Xianbo,Shi ^[2] ; Cigdem,Ozkan Loch ^[3] ; Juraj,Krempasky ^[3] ; Michael,Boege ^[3] ; Dean,Chapman ^[4] ; Marco,Stampanoni ^[3]

作者单位： Paul Scherrer Institute (PSI), 5232, Villigen, Switzerland. nazanin.samadi@psi.ch. ^[1] Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA. ^[2] Paul Scherrer Institute (PSI), 5232, Villigen, Switzerland. ^[3] Anatomy, Physiology and Pharmacology, University of Saskatchewan, Saskatoon, SK, S7N5E5, Canada. ^[4] Institute for Biomedical Engineering, ETH and University of Zurich, 8092, Zurich, Switzerland. ^[5]

DOI 10.1038/s41598-022-23004-3

PMID 36309543

发布时间 2022-11-01

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Scientific reports

2022年12卷1期

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A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources.

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A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources.

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