High-Resolution Melting-Based Marker Development for Wheat Leaf Rust Resistance Gene <i>Lr34</i>.

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第一作者： Shivreet,Kaur

第一单位： Department of Plant Pathology, North Dakota State University, Fargo, ND 58108.

作者： Shivreet,Kaur ^[1] ; Taylor,Pennington ^[1] ; Emily J,Conley ^[2] ; Andrew,Green ^[3] ; James,Kolmer ^[4] ; James,Anderson ^[2] ; Rajeev,Gupta ^[5] ; Upinder,Gill ^[1]

作者单位： Department of Plant Pathology, North Dakota State University, Fargo, ND 58108. ^[1] Department of Agronomy & Plant Genetics, University of Minnesota, St. Paul, MN 55108. ^[2] Department of Plant Sciences, North Dakota State University, Fargo, ND 58108. ^[3] U.S. Department of Agriculture-Agricultural Research Service, Cereal Disease Laboratory, St. Paul, MN 55108. ^[4] U.S. Department of Agriculture-Agricultural Research Service, Cereal Crops Research Unit, Edward T. Schafer Agricultural Research Center, Fargo, ND 58102. ^[5]

关键词 Lr34 adult plant resistance high-resolution melting leaf rust molecular marker wheat

主题词结果可重复性(Reproducibility of Results);植物疾病(Plant Diseases);担子菌纲(Basidiomycota);植物(Plants)

DOI 10.1094/PHYTO-08-22-0313-R

PMID 36346374

发布时间 2023-04-03

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