作者:
Zhe,Zhang [1]
;
Feilong,Song [2]
;
Zhenyao,Li [1]
;
Yuan-Fei,Gao [3]
;
Yu-Jia,Sun [1]
;
Wen-Kai,Lou [2]
;
Xinfeng,Liu [3]
;
Qing,Zhang [1]
;
Ping-Heng,Tan [2]
;
Kai,Chang [1]
;
Jun,Zhang [2]
作者单位:
State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.
[1]
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.
[2]
Beijing Academy of Quantum Information Science, Beijing 100193, China.
[3]
CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center For Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, China.
[4]
Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing 100871, China.
[5]
DOI
10.1021/acs.nanolett.2c03147
PMID
36399405
发布时间
2022-12-22