作者：
Tong,Tong [1]
;
Yuquan,Gan [2]
;
Weisheng,Li [3]
;
Wei,Zhang [4]
;
Haizeng,Song [3]
;
Hehe,Zhang [4]
;
Kan,Liao [3]
;
Jie,Deng [5]
;
Si,Li [3]
;
Ziyue,Xing [6]
;
Yu,Yu [5]
;
Yudi,Tu [7]
;
Wenhui,Wang [8]
;
Jinlian,Chen [4]
;
Jing,Zhou [5]
;
Xuefen,Song [4]
;
Linghai,Zhang [4]
;
Xiaoyong,Wang [3]
;
Shuchao,Qin [2]
;
Yi,Shi [3]
;
Wei,Huang [6]
;
Lin,Wang [4]
作者单位：
Key Laboratory of Flexible Electronics and Institute of Advanced Materials, Nanjing Tech University, Nanjing211816, China.
[1]
School of Physical Science and Information Engineering, Liaocheng University, Liaocheng252059, China.
[2]
National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials, Nanjing University, Nanjing210023, China.
[3]
Key Laboratory of Flexible Electronics and Institute of Advanced Materials, School of Physical and Mathematical Sciences, Nanjing Tech University, Nanjing211816, China.
[4]
State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai200083, China.
[5]
Frontiers Science Center for Flexible Electronics, Xi'an Institute of Flexible Electronics (IFE) and Xi'an Institute of Biomedical Materials & Engineering, Northwestern Polytechnical University, 127 West Youyi Road, Xi'an710072, China.
[6]
Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen518060, China.
[7]
School of Physics, Southeast University, Nanjing211189, China.
[8]
DOI
10.1021/acsnano.2c09284
PMID
36547249
发布时间
2023-01-11
换一批
换一批
