Joint estimation of interaction position and energy deposition in semiconductor SPECT imaging sensors using fully connected neural network.

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第一作者： Can,Yang

第一单位： Department of Nuclear, Plasma, and Radiological Engineering, University of Illinois at Urbana-Champaign, Urbana, United States of America.

作者： Can,Yang ^[1] ; Elena Maria,Zannoni ^[1] ; Ling-Jian,Meng ^[2]

作者单位： Department of Nuclear, Plasma, and Radiological Engineering, University of Illinois at Urbana-Champaign, Urbana, United States of America. ^[1] Department of Nuclear, Plasma, and Radiological Engineering, University of Illinois at Urbana-Champaign, Urbana, United States of America.;Department of Bioengineering, University of Illinois at Urbana-Champaign, Urbana, United States of America.;Beckman Institute, University of Illinois at Urbana-Champaign, Urbana, United States of America. ^[2]

关键词 CdTe/CZT detector charge-sharing energy correction fully connected neural networks machine learning semiconductor detector

主题词镉化合物(Cadmium Compounds);碲(Tellurium);量子点(Quantum Dots);体层摄影术, 发射型计算机, 单光子(Tomography, Emission-Computed, Single-Photon);半导体(Semiconductors)

DOI 10.1088/1361-6560/aca740

PMID 36595331

发布时间 2024-09-21

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准确一般字义偏差语意偏离译文作用小提交