Cardiac implantable electronic device procedure history as the most important predictor of poor 2-year survival after transcatheter aortic valve replacement.

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第一作者： Michał,Stegienta

第一单位： 2nd Department of Cardiology, Central University Hospital, Medical University of Lodz, Łódź, Poland. michal.stegienta@umed.lodz.pl.

作者： Michał,Stegienta ^[1] ; Anita,Korczak ^[2] ; Izabela,Adamowicz ^[2] ; Anna,Ceranka ^[2] ; Milena,Jakuszczonek ^[2] ; Andrzej,Walczak ^[3] ; Michał,Krejca ^[3] ; Aleksandra,Ryk ^[4] ; Jacek,Burzyński ^[2] ; Jarosław,Drożdż

作者单位： 2nd Department of Cardiology, Central University Hospital, Medical University of Lodz, Łódź, Poland. michal.stegienta@umed.lodz.pl. ^[1] 2nd Department of Cardiology, Central University Hospital, Medical University of Lodz, Łódź, Poland. ^[2] Department of Cardiac Surgery, Central University Hospital, Medical University of Lodz, Łódź, Poland. ^[3] Department of Biostatistics and Translational Medicine, Medical University of Lodz, Łódź, Poland. ^[4]

DOI 10.33963/KP.a2023.0058

PMID 36871302

发布时间 2024-07-11

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Kardiologia polska

2023年81卷6期

622-625页

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Cardiac implantable electronic device procedure history as the most important predictor of poor 2-year survival after transcatheter aortic valve replacement.

Kardiologia polska

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Kardiologia polska

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Cardiac implantable electronic device procedure history as the most important predictor of poor 2-year survival after transcatheter aortic valve replacement.

Kardiologia polska

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Kardiologia polska

相关期刊

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