作者：
Michaela,Sojková [1]
;
Igor,Píš [2]
;
Jana,Hrdá [1]
;
Tatiana,Vojteková [1]
;
Lenka,Pribusová Slušná [1]
;
Karol,Vegso [3]
;
Peter,Siffalovic [4]
;
Peter,Nadazdy [3]
;
Edmund,Dobročka [4]
;
Miloš,Krbal [1]
;
Paul J,Fons [1]
;
Frans,Munnik [5]
;
Elena,Magnano [6]
;
Martin,Hulman [7]
;
Federica,Bondino [8]
作者单位：
Institute of Electrical Engineering, SAS, Dúbravská cesta 9, 841 04 Bratislava, Slovakia.
[1]
IOM-CNR, Istituto Officina dei Materiali, S.S. 14 km - 163.5, Basovizza, Trieste 34149, Italy.
[2]
Institute of Physics, Slovak Academy of Sciences, Dúbravská cesta 9, 84511 Bratislava, Slovakia.
[3]
Centre for Advanced Materials Application (CEMEA), Slovak Academy of Sciences, Dúbravská cesta 5807/9, 84511 Bratislava, Slovakia.
[4]
Center of Materials and Nanotechnologies (CEMNAT), Faculty of Chemical Technology, University of Pardubice, Legions Square 565, 530 02 Pardubice, Czech Republic.
[5]
Department of Electronics and Electrical Engineering, Faculty of Science and Technology, Keio University, 223-8522 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan.
[6]
Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, 305-8568 Ibaraki, Japan.
[7]
Helmholtz-Zentrum Dresden-Rossendorf, e.V. Bautzner Landstrasse 400, D-01328 Dresden, Germany.
[8]
Department of Physics, University of Johannesburg, Auckland Park, PO Box 524, 2006 Johannesburg, South Africa.
[9]
DOI
10.1021/acs.chemmater.3c00669
PMID
37637012
发布时间
2023-08-29
换一批
换一批
