Fast and robust Fourier ptychographic microscopy with position misalignment correction.

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第一作者： Zicong,Luo

第一单位： Foshan University, School of Physics and Optoelectronic Engineering, Foshan, China.

作者： Zicong,Luo ^[1] ; Ruofei,Wu ^[1] ; Hanbao,Chen ^[1] ; Junrui,Zhen ^[1] ; Mingdi,Liu ^[1] ; Haiqi,Zhang ^[1] ; Jiaxiong,Luo ^[1] ; Dingan,Han ^[1] ; Lisong,Yan ^[2] ; Yanxiong,Wu ^[1]

作者单位： Foshan University, School of Physics and Optoelectronic Engineering, Foshan, China. ^[1] Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan, China. ^[2] Ji Hua Laboratory, Foshan, China. ^[3]

关键词 Fourier ptychographic microscopy LED position misalignment correction phase retrieval

主题词显微镜检查(Microscopy);傅里叶分析(Fourier Analysis);采光(Lighting);算法(Algorithms)

DOI 10.1117/1.JBO.28.11.116503

PMID 38078152

发布时间 2024-04-22

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准确一般字义偏差语意偏离译文作用小提交