Direct Measurement of the Thermal Expansion Coefficient of Epitaxial WSe<sub>2</sub> by Four-Dimensional Scanning Transmission Electron Microscopy.

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作者： Theresa M,Kucinski ^[1] ; Rohan,Dhall ^[2] ; Benjamin H,Savitzky ^[3] ; Colin,Ophus ^[3] ; Rijan,Karkee ^[3] ; Avanish,Mishra ^[1] ; Enkeleda,Dervishi ^[4] ; Jung Hoon,Kang ^[5] ; Chul-Ho,Lee ^[6] ; Jinkyoung,Yoo ^[6] ; Michael T,Pettes ^[1]

作者单位： Center for Integrated Nanotechnologies (CINT), Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States. ^[1] Nuclear Materials Science Group (MST-16), Materials and Technology Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States. ^[2] National Center for Electron Microscopy (NCEM), The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States. ^[3] Physics and Chemistry of Materials Group (T-1), Theoretical Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States. ^[4] Electrochemistry and Corrosion Team, Sigma Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States. ^[5] Department of Electrical & Computer Engineering, Seoul National University, Seoul 08826, Republic of Korea. ^[6]

关键词 2D materials 4D-STEM MOCVD orientation strain thermal expansion

DOI 10.1021/acsnano.4c02996

PMID 38935815

发布时间 2024-07-14

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