Nanoscale Imaging and Measurements of Grain Boundary Thermal Resistance in Ceramics with Scanning Thermal Wave Microscopy.

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作者： Denis,Alikin ^[1] ; Maria J,Pereira ^[1] ; Alexander,Abramov ^[2] ; Elena,Pashnina ^[2] ; Maria,Chuvakova ^[2] ; Nickolay V,Lavrik ^[3] ; Wenjie,Xie ^[4] ; Anke,Weidenkaff ^[4] ; Andrei L,Kholkin ^[1] ; Andrei,Kovalevsky ^[5] ; Alexander,Tselev ^[1]

作者单位： Department of Physics & CICECO-Aveiro Institute of Materials, University of Aveiro, Aveiro 3810-193, Portugal. ^[1] School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg 620000, Russia. ^[2] Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States. ^[3] Materials and Resources, Department of Materials and Earth Sciences, Technical University of Darmstadt, Darmstadt 64287, Germany.;Fraunhofer Research Institution for Materials Recycling and Resource Strategies IWKS, Alzenau 63755, Germany. ^[4] Department of Materials and Ceramic Engineering & CICECO - Aveiro Institute of Materials, University of Aveiro, Aveiro 3810-193, Portugal. ^[5]

关键词 ceramics grain boundary scanning thermal microscopy scanning thermal-wave microscopy thermal resistance

DOI 10.1021/acsami.4c08085

PMID 39102288

发布时间 2024-08-15

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