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EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries.

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第一作者： Grzegorz,Cios

第一单位： Academic Centre for Materials and Nanotechnology, AGH University of Krakow, al. A. Mickiewicza 30, 30-059 Krakow, Poland. Electronic address: Ciosu@agh.edu.pl.

作者： Grzegorz,Cios ^[1] ; Aimo,Winkelmann ^[2] ; Gert,Nolze ^[3] ; Tomasz,Tokarski ^[2] ; Benedykt R,Jany ^[4] ; Piotr,Bała ^[5]

作者单位： Academic Centre for Materials and Nanotechnology, AGH University of Krakow, al. A. Mickiewicza 30, 30-059 Krakow, Poland. Electronic address: Ciosu@agh.edu.pl. ^[1] Academic Centre for Materials and Nanotechnology, AGH University of Krakow, al. A. Mickiewicza 30, 30-059 Krakow, Poland. ^[2] Federal Institute for Materials, Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin, Germany; TU Bergakademie Freiberg, Institute for Mineralogy, Brennhausgasse 14, 09596 Freiberg, Germany. ^[3] Marian Smoluchowski Institute of Physics, Faculty of Physics, Astronomy and Applied Computer Science, Jagiellonian University, 30348 Krakow, Poland. ^[4] Academic Centre for Materials and Nanotechnology, AGH University of Krakow, al. A. Mickiewicza 30, 30-059 Krakow, Poland; Faculty of Metals and Industrial Computer Science, AGH University of Krakow, al. A. Mickiewicza 30, 30-059 Krakow, Poland. ^[5]

关键词 Contrast inversion EBSD Kikuchi diffraction TKD Topography

DOI 10.1016/j.ultramic.2024.114055

PMID 39321603

发布时间 2024-11-20

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准确一般字义偏差语意偏离译文作用小提交