Suppression of Initial Degradation via an Interfacial Charge-Induced Overshooting Effect in Solution-Processed Organic Light-Emitting Diodes.

导出 LinkOut

翻译打印收藏纠错

作者： Thi Na,Le ^[1] ; Yerin,Kim ^[1] ; Kyu-Myung,Lee ^[2] ; Jong-Am,Hong ^[2] ; Jooyeon,Oh ^[3] ; Yongsup,Park ^[4] ; Min Chul,Suh ^[1]

作者单位： Department of Information Display, College of Sciences, Kyung Hee University, 26 Kyungheedae-ro, Dongdaemun-gu, Seoul 02447, Republic of Korea. ^[1] Department of Physics, College of Sciences, Kyung Hee University, 26 Kyungheedae-ro, Dongdaemun-gu, Seoul 02447, Republic of Korea. ^[2] ASTA Corporation, seventh Fl. AICT BldgA, 145, Gwanggyo-ro, Yeongtoing-gu, Suwon-si, Gyeonggi-do 16229, Republic of Korea. ^[3] Department of Information Display, College of Sciences, Kyung Hee University, 26 Kyungheedae-ro, Dongdaemun-gu, Seoul 02447, Republic of Korea.;Department of Physics, College of Sciences, Kyung Hee University, 26 Kyungheedae-ro, Dongdaemun-gu, Seoul 02447, Republic of Korea. ^[4]

关键词 LDI–TOF double ETL giant surface potential lifetime overshooting solution-processed OLEDs

DOI 10.1021/acsami.4c11945

PMID 39385727

发布时间 2024-12-19

翻译满意度评价：

准确一般字义偏差语意偏离译文作用小提交