End-to-end multi-scale residual network with parallel attention mechanism for fault diagnosis under noise and small samples.
第一作者:
Yawei,Sun
第一单位:
Key Laboratory of Advanced Process Control for Light Industry of Ministry of Education, Jiangnan University, Wuxi, 214122, PR China. Electronic address: 6231913047@stu.jiangnan.edu.cn.
作者:
DOI
10.1016/j.isatra.2024.12.023
PMID
39710537
发布时间
2025-02-10
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ISA transactions
419-433页
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