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Extracting the Temperature Dependence of Both Nanowire Resistivity and Junction Resistance from Electrical Measurements on Printed Silver Nanowire Networks.

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第一作者： Emmet,Coleman

第一单位： School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin D02 PN40, Ireland.

作者： Emmet,Coleman ^[1] ; Adam,Kelly ^[1] ; Cian,Gabbett ^[1] ; Luke,Doolan ^[1] ; Shixin,Liu ^[1] ; Neelam,Yadav ^[2] ; Jagdish K,Vij ^[2] ; Jonathan N,Coleman ^[1]

作者单位： School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin D02 PN40, Ireland. ^[1] Department of Electronic & Electrical Engineering, Trinity College Dublin, Dublin D02 PN40, Ireland. ^[2]

DOI 10.1021/acsaelm.4c01965

PMID 39897075

发布时间 2025-02-04

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ACS applied electronic materials

2025年7卷2期

806-815页

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ACS applied electronic materials

2025年7卷2期

806-815页

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Extracting the Temperature Dependence of Both Nanowire Resistivity and Junction Resistance from Electrical Measurements on Printed Silver Nanowire Networks.

ACS applied electronic materials

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Extracting the Temperature Dependence of Both Nanowire Resistivity and Junction Resistance from Electrical Measurements on Printed Silver Nanowire Networks.

ACS applied electronic materials

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ACS applied electronic materials

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