Automatic Extraction and Compensation of P-Bit Device Variations in Large Array Utilizing Boltzmann Machine Training.
第一作者:
Bolin,Zhang
第一单位:
National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou 311115, China.;Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing 100191, China.
作者:
DOI
10.3390/mi16020133
PMID
40094411
发布时间
2025-03-20
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Micromachines
2025年16卷2期
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