Real-Time Tracking of Nanoscale Morphology and Strain Evolution in Bi<sub>2</sub>WO<sub>6</sub> via Operando Coherent X-Ray Imaging.
第一作者:
Jackson,Anderson
第一单位:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute (RPI), Troy, NY, 12180, USA.
作者:
DOI
10.1002/adma.202504445
PMID
40552552
发布时间
2025-09-19
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